可靠性(半导体)
缩小
休克(循环)
随机变量
数学
相(物质)
统计
组合数学
物理
热力学
数学优化
功率(物理)
医学
量子力学
内科学
标识
DOI:10.1177/1748006x211048992
摘要
In this paper, we propose a shock model for an m-consecutive- k, l-out-of- n: F system. This paper presents a reliability analysis of an m-consecutive- k, l-out-of- n: F system subjected to shocks that destroy a random number of components. One of the main random variables is the number of components affected by successive shocks. Phase-type distributions have been used to model the intervals between successive shocks. The main objective of this study is to show how phase-type distributions can be used to determine the reliability of m-consecutive- k, l-out-of- n: F systems subjected to shocks, which destroy a random number of components. Consideration is given to the optimal replacement time problem, which addresses the minimization of the total long-run average cost per unit time.
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