铟
俄歇电子能谱
低能电子衍射
材料科学
电子衍射
能量色散X射线光谱学
扫描电子显微镜
衍射
扫描隧道显微镜
反射高能电子衍射
分析化学(期刊)
冶金
化学
纳米技术
光学
物理
复合材料
色谱法
核物理学
作者
H. Wider,V. Gimple,William E. Evenson,G. Schätz,Jacek Jaworski,Jiří Prokop,M. Marsza ek
标识
DOI:10.1088/0953-8984/15/12/308
摘要
An ultrathin film of indium deposited on Cu(111) has been studied by an in situ combination of medium-electron energy diffraction, low-energy electron diffraction, scanning tunnelling microscopy and Auger electron spectroscopy. The surface alloys, Cu2In and Cu3In, which do not exist in these structures in the bulk, have been found in this system.
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