固态
材料科学
X射线
显微镜
透射电子显微镜
纳米技术
光电子学
工程物理
光学
物理
作者
J.D. Liu,Yajie Song,Lei Zhu,Wei Zhao,Hanwen An,Zinan Zhou,Zihan Xu,Menglu Li,Biao Deng,Jiajun Wang
标识
DOI:10.1073/pnas.2410406121
摘要
The interface issue poses a limitation on the fast charging of solid-state batteries (SSBs), with the high-impedance non-Faraday electric field serving as a pivotal factor. However, the mechanism of fast-charging capability degradation triggered by the dynamic evolution of non-Faraday electric fields remains unclear due to the lack of particle-scale nondestructive detection techniques. Here, we dissect the generation and elimination processes of non-Faradaic electric field in segments using the developed operando cryogenic transmission X-ray microscopy (Cryo-TXM). This method accurately tracks the ion self-balancing pathways in LiNi 0.8 Co 0.1 Mn 0.1 O 2 (NCM811) post-fast-charging, elucidating the high polarization during late charging caused by exacerbated irreversible local electric field. By intermittently applying reverse potential during fast charging to alleviate the exacerbation of non-Faradaic electric field at the cathode interface, we achieved a roughly 400% reversible capacity increase of SSBs at 10 C. This insightful dynamic imaging method effectively captures and resolves the transient, opaque signals within SSBs, significantly enhancing their fast-charging performance.
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