A computational analysis of transcranial magnetic stimulation in patients with cranial defects and skull plate implants

We utilized computational analysis to investigate the impact of skull defects and skull implants on the TMS-induced EF. Our findings revealed a noteworthy alteration in the induced EF when acute skull defects were present. When high-conductivity titanium plates were used, we observed a pronounced increase in the peak EF, accompanied by a shift in the induced EF from the center towards both ends of the implant. These findings underscore the importance of carefully considering skull defects and implant materials during TMS.