X射线光电子能谱
异质结
空位缺陷
电子顺磁共振
吸附
材料科学
光催化
选择性
电子结构
表面工程
化学工程
纳米技术
物理化学
化学
光电子学
计算化学
催化作用
结晶学
生物化学
物理
核磁共振
工程类
作者
Shuaishuai Liu,Fan Fang,Pengxin Li,Ruixue Sun,Yutong Wan,Kun Chang,Yong Zhou
标识
DOI:10.1021/acs.jpclett.3c02675
摘要
The manipulation of electronic structure and prevention of photogenerated carriers from being quenched in bulk defects during the photocatalytic CO2 reduction reaction (CRR) have been effectively demonstrated through surface vacancy and defect engineering. In this work, the electronic structure on the surface of Zn3In2S6/ZnS (ZIS/ZnS) is significantly modified by the introduction and control of the surface S vacancies (SV) through Ar-plasma treatment. EPR and XPS analyses confirmed that SV was exclusively present on the ZIS/ZnS surface. The resulting ZIS/ZnS heterojunction photocatalysts demonstrate an impressive 46.6% selectivity toward C2 products even in the absence of cocatalysts. The mechanism of photocatalytic CRR is further elucidated through in situ analysis. Theoretical calculations demonstrate that the presence of In and Zn atoms adjacent to SV significantly enhances the adsorption of CO2 and facilitates C–C coupling.
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