材料科学
扫描隧道显微镜
相变
薄膜
硅
结晶学
凝聚态物理
化学物理
纳米技术
化学
光电子学
物理
作者
Leonid Lichtenstein,Markus Heyde,Hans‐Joachim Freund
标识
DOI:10.1103/physrevlett.109.106101
摘要
The interface between a crystalline and a vitreous phase of a thin metal supported silica film was studied by low temperature scanning tunneling microscopy. The locally resolved evolution of Si-Si nearest neighbor distances and characteristic angles was evaluated across the border. Furthermore, we investigated the behavior of the ring size distribution close to the crystalline-vitreous transition. The crystalline order was found to decay gradually within about 1.6 nm into the vitreous state.
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