光电子学
材料科学
发光二极管
紫外线
电致发光
异质结
二极管
发光
纳米技术
图层(电子)
作者
Enqin Zhao,Zhiang Yue,Xian Zhang,Shuaikang Wei,Guojiao Xiang,Jinming Zhang,Meibo Xin,Fujing Dong,Hui Wang,Yang Zhao
标识
DOI:10.1021/acsaelm.4c02014
摘要
Aluminum nitride (AlN) thin films are widely used in optoelectronic devices. Ultraviolet (UV) and violet light-emitting diodes (LEDs) of the Au/i-AlN/p-GaN metal–insulator-semiconductor (MIS) structure were prepared by magnetron sputtering, which can achieve bidirectional luminescence. The result of I–V tests at variable temperatures indicated that the device exhibits highly stable rectification characteristics at different ambient temperatures. Under a driving current (0.02 mA), purple light was detected under forward bias and reverse bias. With the increase of driving current (1–2.5 mA), strong purple light was emitted under forward bias, and strong ultraviolet light emission was detected under reverse bias. In addition, considering the influence of temperature on the luminescence intensity, the electroluminescence (EL) test was carried out under the condition of variable temperature in both forward and reverse cases. Finally, the EL mechanism of the device was analyzed by Gaussian peak fitting of the spectrum and energy band structure. The research of bidirectional ultraviolet and violet LEDs based on the Au/i-AlN/p-GaN MIS structure provides an effective method for designing and developing a simple structure UV-LED.
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