杂质
材料科学
半导体
无定形固体
氧化物
溅射
氢
沉积(地质)
化学物理
分析化学(期刊)
无机化学
化学工程
纳米技术
光电子学
化学
结晶学
冶金
薄膜
有机化学
生物
沉积物
工程类
古生物学
作者
Hideo Hosono,Toshio Kamiya
标识
DOI:10.1002/9781119715641.ch7
摘要
Hydrogen is an unavoidable impurity species in oxide semiconductor thin films. The concentration of H-impurity in conventional sputtering-deposited AOS (amorphous oxide semiconductor) thin films goes up to 10 20 –10 21 cm −3 . These hydrogen species are incorporated during vacuum deposition processes through reactions with residual gas species, H 2 O and H 2 , in the vacuum chamber. This chapter describes the current understanding of hydrogen-related impurities and defects in AOS materials, focusing on their chemical states, energy levels, and influence on carrier generation and annihilation.
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