比较器
逐次逼近ADC
压控振荡器
CMOS芯片
电子工程
功勋
计算机科学
探测器
相位检测器
奈奎斯特-香农抽样定理
比较器应用
电压
12位
炸薯条
电气工程
工程类
电信
计算机视觉
作者
Xin Xin,Yuanhao Hu,Xingyuan Tong
标识
DOI:10.1109/icta53157.2021.9662034
摘要
This paper presents a 10-bit successive approximation register (SAR) analog-to-digital converter (ADC) with adaptive Fig. 1. 10-bit SAR ADC with the proposed AVB comparator voltage-controlled oscillator (VCO)-based comparator for sensor chip. The proposed adaptive VCO-based (AVB) comparator can improve the speed in large differential input, and reduce the power of the phase detector in small differential input. The simulation results show that the proposed SAR ADC achieves 57.68-dB SNDR and consumes 140 nW under a supply of 0.6-V at the Nyquist input rate, resulting in a Walden Figure-of-merit (FoM) with 11.1 fJ/conversion-step in a 180nm CMOS process.
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