X射线光电子能谱
金红石
X射线
氢
X射线光谱学
材料科学
化学
结晶学
光谱学
分析化学(期刊)
核磁共振
物理
光学
色谱法
量子力学
有机化学
作者
M. S. Lazarus,Tsun‐Kong Sham
标识
DOI:10.1016/0009-2614(82)83672-5
摘要
XPS measurements have been made on reduced rutile surfaces under various conditions. It is found that upon exposure to H2O the amphoteric hydroxyl groups previously detected on the surface of the unreduced TiO2 are not present in the reduced sample. Results and their consequences are discussed.
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