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Avoiding Photoinduced Shunts in Organic Solar Cells by the Use of Tin Oxide (SnOx) as Electron Extraction Material Instead of ZnO

材料科学 氧化锡 氧化物 电子 氧化铟锡 光电子学 纳米技术 薄膜 冶金 物理 量子力学
作者
Sara Trost,Tim Becker,Andreas Polywka,Patrick Görrn,Marcin Oszajca,Norman A. Luechinger,Detlef Rogalla,Mirko Weidner,Philip Reckers,Thomas Mayer,Thomas Riedl
出处
期刊:Advanced Energy Materials [Wiley]
卷期号:6 (15) 被引量:65
标识
DOI:10.1002/aenm.201600347
摘要

Advanced Energy MaterialsVolume 6, Issue 15 1600347 Communication Avoiding Photoinduced Shunts in Organic Solar Cells by the Use of Tin Oxide (SnOx) as Electron Extraction Material Instead of ZnO Sara Trost, Sara Trost Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorTim Becker, Tim Becker Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorAndreas Polywka, Andreas Polywka Chair of Large Area Optoelectronics, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorPatrick Görrn, Patrick Görrn Chair of Large Area Optoelectronics, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorMarek F. Oszajca, Marek F. Oszajca Nanograde AG, Laubisrütistrasse 50, 8712 Stäfa, SwitzerlandSearch for more papers by this authorNorman A. Luechinger, Norman A. Luechinger Nanograde AG, Laubisrütistrasse 50, 8712 Stäfa, SwitzerlandSearch for more papers by this authorDetlef Rogalla, Detlef Rogalla RUBION, Ruhr-Universität Bochum, Universitätsstr. 150, 44801 Bochum, GermanySearch for more papers by this authorMirko Weidner, Mirko Weidner Surface Science Division, Institute of Materials Science, Darmstadt University of Technology, Petersenstraße 32, 64287 Darmstadt, GermanySearch for more papers by this authorPhilip Reckers, Philip Reckers Surface Science Division, Institute of Materials Science, Darmstadt University of Technology, Petersenstraße 32, 64287 Darmstadt, GermanySearch for more papers by this authorThomas Mayer, Thomas Mayer Surface Science Division, Institute of Materials Science, Darmstadt University of Technology, Petersenstraße 32, 64287 Darmstadt, GermanySearch for more papers by this authorThomas Riedl, Corresponding Author Thomas Riedl Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanyE-mail: t.riedl@uni-wuppertal.deSearch for more papers by this author Sara Trost, Sara Trost Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorTim Becker, Tim Becker Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorAndreas Polywka, Andreas Polywka Chair of Large Area Optoelectronics, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorPatrick Görrn, Patrick Görrn Chair of Large Area Optoelectronics, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanySearch for more papers by this authorMarek F. Oszajca, Marek F. Oszajca Nanograde AG, Laubisrütistrasse 50, 8712 Stäfa, SwitzerlandSearch for more papers by this authorNorman A. Luechinger, Norman A. Luechinger Nanograde AG, Laubisrütistrasse 50, 8712 Stäfa, SwitzerlandSearch for more papers by this authorDetlef Rogalla, Detlef Rogalla RUBION, Ruhr-Universität Bochum, Universitätsstr. 150, 44801 Bochum, GermanySearch for more papers by this authorMirko Weidner, Mirko Weidner Surface Science Division, Institute of Materials Science, Darmstadt University of Technology, Petersenstraße 32, 64287 Darmstadt, GermanySearch for more papers by this authorPhilip Reckers, Philip Reckers Surface Science Division, Institute of Materials Science, Darmstadt University of Technology, Petersenstraße 32, 64287 Darmstadt, GermanySearch for more papers by this authorThomas Mayer, Thomas Mayer Surface Science Division, Institute of Materials Science, Darmstadt University of Technology, Petersenstraße 32, 64287 Darmstadt, GermanySearch for more papers by this authorThomas Riedl, Corresponding Author Thomas Riedl Institute of Electronic Devices, University of Wuppertal, Rainer-Gruenter-Str. 21, 42119 Wuppertal, GermanyE-mail: t.riedl@uni-wuppertal.deSearch for more papers by this author First published: 02 June 2016 https://doi.org/10.1002/aenm.201600347Citations: 54Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Graphical Abstract Organic solar cells using zinc oxide (ZnO) based electron extraction layers (EELs) show a lowered shunt resistance along with a decay of the filling factor and open circuit voltage upon UV illumination, due to a loss of electron selectivity of the EEL. This issue is overcome by tin oxide (SnOx) as EEL, with a surface electronic structure different from ZnO. Citing Literature Supporting Information As a service to our authors and readers, this journal provides supporting information supplied by the authors. Such materials are peer reviewed and may be re-organized for online delivery, but are not copy-edited or typeset. Technical support issues arising from supporting information (other than missing files) should be addressed to the authors. Filename Description aenm201600347-sup-0001-S1.pdf380.3 KB Supplementary Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article. Volume6, Issue15August 10, 20161600347 RelatedInformation

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