X射线光电子能谱
离子
光电发射光谱学
材料科学
带隙
光谱学
分析化学(期刊)
光电子学
薄膜
外延
化学
纳米技术
物理
核磁共振
有机化学
图层(电子)
色谱法
量子力学
作者
Thomas Fix,Yahya Zakaria,D. Stoeffler,D. Müller,A. Dinia,A. Slaoui
出处
期刊:Solar RRL
[Wiley]
日期:2024-04-22
卷期号:8 (12)
被引量:5
标识
DOI:10.1002/solr.202400237
摘要
SrTiO 3 (STO) is a well‐known perovskite oxide often used, among others, as a crystalline substrate for epitaxial deposition. However, its indirect bandgap of 3.25 eV is too high for solar applications. Tentative experiments to reduce its bandgap are very welcome. To this end, sulfurization of STO substrates using ion implantation is performed. The simulated profile is controlled by time‐of‐flight secondary‐ion mass spectrometry. S is at least partially inserted into the STO lattice, as evidenced by X‐ray diffraction and X‐ray photoelectron spectroscopy. UV–vis spectroscopy indicates a drastic reduction of the bandgap of S:STO from 3.25 eV (indirect) down to 2.14 eV for 10% S:STO, a trend also observed by spectroscopic ellipsometry. The results are confronted to ab initio calculations. Besides bandgap, the valence band level, that is the ionization energy, is determined by ambient‐pressure photoemission spectroscopy so that the complete energy diagrams could be plotted. This work paves the way for tuning the bandgap of perovskites in a highly controlled manner for solar energy applications.
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