材料科学
逆变器
晶体管
光电子学
电容
阈下斜率
肖特基势垒
半导体
场效应晶体管
电压
电气工程
物理
二极管
电极
量子力学
工程类
作者
Jingli Wang,Xuyun Guo,Zhihao Yu,Zichao Ma,Yanghui Liu,Ziyuan Lin,Masun Chan,Ye Zhu,Xinran Wang,Yang Chai
标识
DOI:10.1002/adfm.202003859
摘要
Abstract A fundamental limit for the supply voltage of conventional field‐effect transistors is the long high‐energy tail of the Boltzmann distribution of the carrier population at the source junction, which requires a gate voltage at least 60 mV to change one decade of current. Here 2D semiconductors are adopted as channel materials and hafnium zirconium oxide (HZO) as negative capacitance (NC) gate stack to realize low‐power complementary logic inverter. With HZO/Al 2 O 3 NC gate stack, the 2D semiconductor field‐effect transistor (FET) shows an average subthreshold slope less than Boltzmann limit (as low as 18 mV dec −1 ) at room temperature for both forward and reverse gate voltage sweeps, which allows to reach the same ON‐state current at a lower V dd without increasing the OFF‐state current. The drain current can be modulated by 5 × 10 4 within 220 mV, still exhibiting average SS below 60 mV dec −1 . By constructing van der Waals contact to improve the charge injection and control the carrier type, unipolar p‐type WSe 2 FET with reduced hole Schottky barrier height is achieved. The complementary inverter with MoS 2 and WSe 2 NCFETs shows the power consumption of 68 pW.
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