堆积
二硫化钼
拉曼光谱
材料科学
激子
辉钼矿
钼
Crystal(编程语言)
激发
结晶学
分子物理学
晶体结构
化学物理
凝聚态物理
化学
光学
核磁共振
物理
复合材料
冶金
量子力学
程序设计语言
流体包裹体
计算机科学
石英
作者
Jae‐Ung Lee,Kangwon Kim,Song‐Hee Han,Gyeong Hee Ryu,Zonghoon Lee,Hyeonsik Cheong
出处
期刊:ACS Nano
[American Chemical Society]
日期:2016-01-12
卷期号:10 (2): 1948-1953
被引量:108
标识
DOI:10.1021/acsnano.5b05831
摘要
Since the stacking order sensitively affects various physical properties of layered materials, accurate determination of the stacking order is important for studying the basic properties of these materials as well as for device applications. Because 2H-molybdenum disulfide (MoS2) is most common in nature, most studies so far have focused on 2H-MoS2. However, we found that the 2H, 3R, and mixed stacking sequences exist in few-layer MoS2 exfoliated from natural molybdenite crystals. The crystal structures are confirmed by HR-TEM measurements. The Raman signatures of different polytypes are investigated by using three different excitation energies that are nonresonant and resonant with A and C excitons, respectively. The low-frequency breathing and shear modes show distinct differences for each polytype, whereas the high-frequency intralayer modes show little difference. For resonant excitations at 1.96 and 2.81 eV, distinct features are observed that enable determination of the stacking order.
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