电容
有机发光二极管
AMOLED公司
寄生电容
串扰
像素
薄膜晶体管
光电子学
材料科学
电极
电气工程
电子工程
有源矩阵
光学
物理
工程类
纳米技术
图层(电子)
量子力学
作者
Tingliang Liu,Huijuan Yang,Yi Zhang,Yue Long,Yuanjie Xu,Ming Hu,Ko Youngyik
摘要
The Simulation Model of Back Plane Circuit Vertical Crosstalk (BP‐VC) of AM‐OLED displays was established according to the experimental VC test method in this paper. The impact of the Pixel Storage capacitance (C st ) and the Parasitic Capacitance had been studied. Pixel with good simulated VC had been optimized by increasing C st and decreasing the parasitic capacitance of gate electrode of driving TFT (N1 node) and Gate line (Cap2), thus reaching the achievement that BP‐VC decreases from 1.54% to 0.76% in 6.5 inch FHD OLED Display.
科研通智能强力驱动
Strongly Powered by AbleSci AI