扫描透射电子显微镜
电子全息术
分辨率(逻辑)
能量过滤透射电子显微镜
扫描共焦电子显微镜
反射高能电子衍射
电子
电子断层摄影术
电子显微镜
电子光学
材料科学
高分辨率透射电子显微镜
光学
常规透射电子显微镜
透射电子显微镜
物理
纳米技术
电子衍射
计算机科学
衍射
量子力学
人工智能
标识
DOI:10.1093/acprof:oso/9780199668632.001.0001
摘要
High-resolution electron microscopy covers both the practice and theory of atomic-resolution transmission electron microscopy (TEM) in all its modern forms and applications, with the aim of ‘seeing atoms’ This new edition takes full account of the discovery of aberration correction techniques, which now allow electron microscopes to see detail as small as one atom. The type and arrangement of atoms gives materials their properties and organisms their function. The book presents clearly the underlying theory of atomic-resolution TEM and scanning transmission electron microscopy (STEM), and also contains detailed practical advice, with examples. The book includes chapters devoted to cryo-electron microscopy (for biologists) and nanoscience (for materials scientists and condensed matter physicists). Additional chapters are devoted to imaging at atomic resolution in three dimensions, to a review of electron optics, to electron sources and detectors, electron holography, electron microdiffraction methods, phase-contrast theory, the theory of aberration correction, energy-loss spectroscopy, cathodoluminescence in STEM, diagnosis of resolution-limiting factors, experimental technique, data analysis software, auto-tuning, electron Ronchigrams, and the measurement of mechanical and electronic instabilities.
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