薄膜晶体管
平面的
饱和(图论)
晶体管
材料科学
光电子学
阈值电压
饱和电流
排水诱导屏障降低
电压
电介质
电流(流体)
频道(广播)
功率(物理)
水平和垂直
电气工程
计算机科学
纳米技术
物理
电信
工程类
地质学
数学
计算机图形学(图像)
图层(电子)
组合数学
量子力学
大地测量学
作者
Sugandha Yadav,Poornima Mittal,Shubham Negi
出处
期刊:Physica Scripta
[IOP Publishing]
日期:2024-01-02
卷期号:99 (2): 025940-025940
被引量:2
标识
DOI:10.1088/1402-4896/ad1a00
摘要
Abstract The basic performance parameters such as threshold voltage, drain current and saturation mobility play an important role for any transistor-based devices. The planar organic TFT provides a good performance but it is still not satisfactory. Therefore, in this paper, a vertical channel TFT (D 5 ) is proposed that exhibits a significant improvement for threshold voltage V t , drain current I Dmax and saturation mobility μ sat in comparison to planar devices. The proposed vertical device (D 5 ) is 44 and 24 times enhanced in comparison with planar device D 1 in terms of I Dmax and μ sat , correspondingly. Furthermore, this paper compares five different vertical-channel device architectures (D 2 , D 3 , D 4 , D 5 , D 6 & D 7 ). Out of these structures, our proposed novel structure (D 5 ) shows remarkable performance in terms of drain current (528 μ A) and saturation mobility (80.8 cm 2 /V.s). As compared to the best mentioned vertical devices D 2 , D 3 and D 7 , the proposed device exhibits 41.8 %, 15.6 % and 27.8 %, increment in drain current, respectively. Additionally, the proposed device exhibits about 2.7, 5.2 and 3.5 times improvement in comparison with D 2 , D 3 and D 7 correspondingly. The reasons for this better performance of the proposed device have been explained by vertical and horizontal cutline analysis.
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