材料科学
薄膜
光电子学
超晶格
外延
热导率
分子束外延
砷化镓
纳米技术
工程物理
复合材料
图层(电子)
工程类
作者
Xixing Wen,Mingjie Wen,Changyu Ye,S. Yu,Shuai Yue,Toh‐Ming Lu,Qiang Zhao
标识
DOI:10.1021/acs.jpclett.4c03038
摘要
Heat dissipation has become a critical challenge in modern electronics, driving the need for a revolution in thermal management strategies beyond traditional packaging materials, thermal interface materials, and heat sinks. Cubic boron arsenide (c-BAs) offers a promising solution, thanks to its combination of high thermal conductivity and high ambipolar mobility, making it highly suitable for applications in both electronic devices and thermal management. However, challenges remain, particularly in the large-scale synthesis of a high-quality material and the tuning of its physical properties. This Perspective reviews key research on c-BAs and discusses the future potential of van der Waals (vdW) epitaxy and remote epitaxy for preparing high-quality c-BAs thin-films. Based on superlattice area mismatch calculations, we predict some potential substrates for these epitaxy techniques. Three important design considerations for future vdW or remote epitaxy of c-BAs thin-films are identified: superlattice matching at the heterointerface, the kinetics of B and As adatoms, and the surface modification of vdW or vdW/3D substrates.
科研通智能强力驱动
Strongly Powered by AbleSci AI