嵌入
校准
固定装置
试验夹具
计算机科学
电子工程
工程类
数学
人工智能
机械工程
统计
程序设计语言
作者
Se-Jung Moon,Xiaoning Ye,R. Neal Smith
标识
DOI:10.1109/emcsi.2015.7107681
摘要
In this paper, TRL (Through-Reflect-Multiple Lines) and 2x thru de-embedding schemes of AFR (Automatic Fixture Removal) and SFD (Smart Fixture De-embedding) are compared from various perspectives: calibration fixture design, calibration / de-embedding procedure, and the measurement accuracy. Especially for the accuracy comparison, one of our test boards which support TRL calibration up to 40 GHz was used. In order to derive a valid conclusion, the calibration / de-embedding standards were thoroughly examined and calibration stability and de-embedding accuracy were tested. The comparison showed excellent correlation in IL, RL, NEXT and FEXT over the full frequency range of measurement, while the 2x thru de-embedding method significantly simplifies the de-embedding procedures.
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