嵌入                        
                
                                
                        
                            校准                        
                
                                
                        
                            固定装置                        
                
                                
                        
                            试验夹具                        
                
                                
                        
                            计算机科学                        
                
                                
                        
                            电子工程                        
                
                                
                        
                            工程类                        
                
                                
                        
                            数学                        
                
                                
                        
                            人工智能                        
                
                                
                        
                            机械工程                        
                
                                
                        
                            统计                        
                
                                
                        
                            程序设计语言                        
                
                        
                    
            作者
            
                Se-Jung Moon,Xiaoning Ye,Rex Smith            
         
            
    
            
            标识
            
                                    DOI:10.1109/emcsi.2015.7107681
                                    
                                
                                 
         
        
                
            摘要
            
            In this paper, TRL (Through-Reflect-Multiple Lines) and 2x thru de-embedding schemes of AFR (Automatic Fixture Removal) and SFD (Smart Fixture De-embedding) are compared from various perspectives: calibration fixture design, calibration / de-embedding procedure, and the measurement accuracy. Especially for the accuracy comparison, one of our test boards which support TRL calibration up to 40 GHz was used. In order to derive a valid conclusion, the calibration / de-embedding standards were thoroughly examined and calibration stability and de-embedding accuracy were tested. The comparison showed excellent correlation in IL, RL, NEXT and FEXT over the full frequency range of measurement, while the 2x thru de-embedding method significantly simplifies the de-embedding procedures.
         
            
 
                 
                
                    
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