降级(电信)
分层(地质)
可靠性(半导体)
光伏系统
材料科学
层压
加速老化
压力(语言学)
可靠性工程
光电子学
电子工程
计算机科学
复合材料
电气工程
工程类
哲学
图层(电子)
语言学
功率(物理)
古生物学
物理
生物
构造学
量子力学
俯冲
作者
Dennice M. Roberts,Soňa Uličná,Michael Owen‐Bellini,Paul F. Ndione,H. R. Moutinho,K. M. Terwilliger,Steve Johnston,Laura T. Schelhas,Dana B. Sulas‐Kern
标识
DOI:10.1109/pvsc48320.2023.10359706
摘要
Bifacial photovoltaic modules are increasing in deployment due to advantages in energy generation, and these advanced module packaging architectures present new reliability considerations. Here, we study bifacial packaging architectures and assess the effects of module processing quality, rear-side module coverings, and polymer encapsulant chemistry on aging and degradation. We determine that mini-modules aged by accelerated testing adapted from IEC 63209-2 show similar degradation trends to nominally identical modules aged outdoors. We find lamination processing conditions have a significant effect on early degradation. We investigate degradation modes non-destructively using luminescence imaging, current-voltage performance, and external quantum efficiency. Finally, we assess chemical and mechanical characteristics of various encapsulant formulations to compare adhesion changes that may result in cell delamination.
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