荧光粉
发光
材料科学
锌
空位缺陷
发光二极管
猝灭(荧光)
发射强度
二极管
分析化学(期刊)
青色
光电子学
化学
荧光
物理
结晶学
冶金
光学
色谱法
作者
Yi Wei,Hang Yang,Zhiyu Gao,Xiaohan Yun,Gongcheng Xing,Chenggang Zhou,Guogang Li
标识
DOI:10.1002/lpor.202000048
摘要
Abstract Thermal quenching (TQ) of phosphor is one of the biggest challenges to develop high‐quality white light‐emitting diodes ( w ‐LEDs). Herein, an anti‐thermal‐quenching (anti‐TQ) property in cyan‐emitting Ba 2 ZnGe 2 O 7 :Bi 3+ phosphor is reported. At 150 °C, its emission intensity increases to 114% of the original intensity at 25 °C. Especially, the integrated emission intensity reaches 138%, 148%, and 134% at 150, 200, and 250 °C, respectively, by artificially creating zinc and oxygen vacancy defect. The anti‐TQ phenomenon is mainly attributed to high structure rigidity and strong ability to compensate emission loss during thermal generation process. Thermal‐induced emission compensation mainly stems from self‐oxidization behavior of Bi 2+ in zinc vacancy and the presence of oxygen vacancy defect. Oxygen vacancy is induced by native zinc vacancy and charge imbalance between Bi 3+ and Ba 2+ ions. The strategy to create oxygen vacancy defect and design self‐oxidization process of Bi opens a new insight to exploit anti‐TQ phosphors for high‐quality w ‐LEDs applications.
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