铁电性
材料科学
小型化
光电子学
二极管
整改
偶极子
范德瓦尔斯力
半导体
铁电电容器
纳米技术
电介质
电气工程
电压
物理
量子力学
工程类
分子
作者
Mingjin Dai,Kai Li,Fakun Wang,Yunxia Hu,Jia Zhang,Tianyou Zhai,Bin Yang,Yongqing Fu,Wenwu Cao,Dechang Jia,Yu Zhou,PingAn Hu
标识
DOI:10.1002/aelm.201900975
摘要
Abstract Miniaturization of device elements, such as ferroelectric diodes, depends on the downscaling of ferroelectric film, which is also crucial for developing high‐density information storage technologies of ferroelectric random access memories (FeRAMs). Recently emerged ferroelectric two‐dimensional (2D) van der Waals (vdWs) layered materials bring an additional opportunity to further increase the density of FeRAMs. A lateral, switchable rectifier is designed and fabricated based on atomically thin 2D α‐In 2 Se 3 ferroelectric diodes, thus breaking the thickness limitation of conventional ferroelectric films and achieving an unprecedented level of miniaturization. This is realized through the interrelated coupling between out‐of‐plane and in‐plane dipoles at room temperature; that is, horizontal polarization reversal can be effectively controlled through a vertical electric field. Being further explored as a switchable rectifier, the obtained maximum value of rectification ratio for the α‐In 2 Se 3 based ferroelectric diode can reach up to 2.5 × 10 3 . These results indicate that 2D ferroelectric semiconductors can offer a pathway to develop next‐generation multifunctional electronics.
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