二元分析
指数函数
蒙特卡罗方法
可靠性(半导体)
指数分布
计算机科学
应用数学
可靠性工程
数学
统计
工程类
物理
数学分析
功率(物理)
量子力学
标识
DOI:10.1109/rams.2005.1408356
摘要
This paper evaluates the accuracy of two Monte-Carlo simulation methods that draw the minimum of two correlated exponentials. This evaluation is done by comparing the simulation results against the results from two well-known analytical bivariate exponential distribution (BED) sources. Then, the future systems are simulated to obtain the probability density functions (PDF) of the system lives from which the reliability expressions are derived. Results show that simulation is a viable tool in analyzing the reliability of systems composed of correlated components. Positive correlation seems to increase both the mean and the standard deviation of the lives of both systems.
科研通智能强力驱动
Strongly Powered by AbleSci AI