外延
碳化硅
异质结
材料科学
钻石
格子(音乐)
透射电子显微镜
凝聚态物理
金刚石材料性能
晶体缺陷
光电子学
高分辨率透射电子显微镜
纳米技术
复合材料
物理
图层(电子)
声学
作者
A. Tsai,Alireza Aghajamali,Nikolai Dontschuk,Brett C. Johnson,Muhammad Usman,Alex K. Schenk,Michael J. Sear,C. I. Pakes,Lloyd C. L. Hollenberg,J. C. McCallum,Sergey Rubanov,Anton Tadich,N. A. Marks,Alastair Stacey
出处
期刊:ACS applied electronic materials
[American Chemical Society]
日期:2020-06-12
卷期号:2 (7): 2003-2009
被引量:8
标识
DOI:10.1021/acsaelm.0c00289
摘要
We demonstrate locally the coherent formation of silicon carbide (SiC) on diamond, a rare example of heteroepitaxy with a lattice mismatch that exceeds 20%. High-resolution transmission electron microscopy confirms the quality and atomic structure near the interface. Guided by molecular dynamics simulations, a theoretical model is proposed for the interface wherein the large lattice strain is alleviated via point dislocations in a two-dimensional plane without forming extended defects in three dimensions. The possibility of realizing heterojunctions of technologically important materials such as SiC with diamond offers promising pathways for thermal management of high-power electronics. At a fundamental level, the study redefines our understanding of SiC and diamond heteroepitaxy and furthers our understanding of large lattice mismatched interfaces.
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