材料科学
非易失性存储器
光电子学
铁电性
晶体管
欧姆接触
电压
二极管
阈值电压
切换时间
电气工程
纳米技术
图层(电子)
电介质
工程类
作者
Yongjae Cho,Hyunmin Cho,Sungjae Hong,Donghee Kang,Yeonjin Yi,Cheolmin Park,Ji Hoon Park,Seongil Im
出处
期刊:Nano Energy
[Elsevier]
日期:2020-12-16
卷期号:81: 105686-105686
被引量:14
标识
DOI:10.1016/j.nanoen.2020.105686
摘要
Two dimensional (2D) p-MoTe2 channel-based nonvolatile memory transistors with ferroelectric P(VDF-TrFE) polymer has been studied using a bottom-gate device architecture, which is introduced to dramatically reduce both of the switching and drain voltages to minimum 8 V and 10 mV, respectively. In fact, most of 2D-channel ferroelectric FETs with the same P(VDF-TrFE) polymer have used top-gate architectures, utilizing high switching pulse voltages over 20–25 V due to the existence of dead layer, which is unavoidably formed at the interface between P(VDF-TrFE) and thermal-deposited Al top gate. Key effects to realize such a low 8–13 V switching thus originate from the bottom-gate architecture. On the one hand, keys to obtain the low operation/drain voltage come from anneal-free Ohmic contact which is obtained using H2O2 solution. Thanks to the low operation voltages of 10 mV, consuming power in the nonvolatile FETs can be minimized to ~a few pW for OFF/Erase state and ~a few hundred pW for ON/Program although it eventually becomes ~nW and ~30 nW for OFF and ON states in a practical circuit operation to switch organic light emitting diodes. Our approaches of bottom-gate architecture and H2O2 contact nicely work even for transparent nonvolatile memory FET.
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