全向天线
光学
材料科学
平面的
反射器(摄影)
圈地
电介质
千分尺
涂层
宽带
辐射冷却
物理
光电子学
天线(收音机)
纳米技术
计算机科学
光源
计算机图形学(图像)
热力学
电信
作者
Yoel Fink,Joshua N. Winn,Shanhui Fan,Chiping Chen,Jürgen Michel,John D. Joannopoulos,Edwin L. Thomas
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:1998-11-27
卷期号:282 (5394): 1679-1682
被引量:1226
标识
DOI:10.1126/science.282.5394.1679
摘要
A design criterion that permits truly omnidirectional reflectivity for all polarizations of incident light over a wide selectable range of frequencies was used in fabricating an all-dielectric omnidirectional reflector consisting of multilayer films. The reflector was simply constructed as a stack of nine alternating micrometer-thick layers of polystyrene and tellurium and demonstrates omnidirectional reflection over the wavelength range from 10 to 15 micrometers. Because the omnidirectionality criterion is general, it can be used to design omnidirectional reflectors in many frequency ranges of interest. Potential uses depend on the geometry of the system. For example, coating of an enclosure will result in an optical cavity. A hollow tube will produce a low-loss, broadband waveguide, whereas a planar film could be used as an efficient radiative heat barrier or collector in thermoelectric devices.
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