材料科学
等效串联电阻
钙钛矿(结构)
光伏系统
光强度
太阳能电池
光电子学
扩散
重组
强度(物理)
接口(物质)
工程物理
光学
化学工程
电气工程
热力学
物理
工程类
基因
复合材料
电压
化学
量子力学
毛细管作用
生物化学
毛细管数
作者
Damian Głowienka,Yulia Galagan
标识
DOI:10.1002/adma.202105920
摘要
The number of publications on perovskite solar cells (PSCs) continues to grow exponentially. Although the efficiency of PSCs has exceeded 25.5%, not every research laboratory can reproduce this result or even pass the border of 20%. Unfortunately, it is not always clear which dominating mechanism is responsible for the performance drop. Here, a simple method of light intensity analysis of the JV parameters is developed, allowing an understanding of what the mechanisms are that appear in the solar cell and limit device performance. The developed method is supported by the drift-diffusion model and is aimed at helping in the explanation of parasitic losses from the interface or bulk recombination, series resistance, or shunt resistance in the perovskite solar cell. This method can help not only point toward the dominating of bulk or interface recombination in the devices but also determine which interface is more defective. A detailed and stepwise guidance for such a type of light intensity analysis of JV parameters is provided. The proposed method and the conclusions of this study are supported by a series of case studies, showing the effectiveness of the proposed method on real examples.
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