材料科学
光电探测器
响应度
异质结
光电子学
光探测
比探测率
化学气相沉积
单层
热光电伏打
范德瓦尔斯力
纳米技术
物理
共发射极
量子力学
分子
作者
Honglei Gao,Changhui Du,Li‐Jun Chen,Wenjia Wang,Kuilong Li
标识
DOI:10.1002/admi.202102350
摘要
Abstract Recently, group‐X transition metal dichalcogenides with tunable distinct optical and superior electrical properties have displayed profound potential in various optoelectronic devices. In this work, novel van der Waals (vdWs) heterostructures composed of monolayer MoS 2 and few‐layer PdSe 2 grown by chemical vapor deposition are employed in photodetectors for broadband and polarized photodetection. Excitingly, optoelectronic measurements show that the MoS 2 /PdSe 2 photodetector is sensitive to near‐infrared light with responsivity as high as 6.9 A W −1 , specific detectivity up to 6.3 × 10 10 Jones, and a rapid response speed of 0.378/0.708 s at 830 nm. This is mainly attributed to the enhanced light absorption and the type‐II band alignment of the heterostructure. Under illumination, not only the intralayer excitations but also the interlayer excitations contribute to the carrier's generation in relevant layers, which enables the broadband photoresponse. In addition, this photodetector also exhibits a good polarization sensitivity with dichroic ratio about 1.34. All these results demonstrate that the MoS 2 /PdSe 2 vdWs heterostructures are suitable for the realization of next‐generation high‐performance broad and polarized photodetectors.
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