高功率脉冲磁控溅射
氮化硅
材料科学
透射率
硅
溅射沉积
涂层
防反射涂料
氮化硅
光电子学
沉积(地质)
图层(电子)
可见光谱
溅射
薄膜
复合材料
光学
纳米技术
古生物学
物理
生物
沉积物
作者
Bo-Huei Liao,Chien‐Nan Hsiao,Ming Hua Shiao,Sheng‐Hui Chen
标识
DOI:10.1364/oic.2016.wa.9
摘要
In this research, silicon nitride and silicon oxynitride films are prepared by a combined high-power impulse and closed field unbalanced magnetron sputtering (HIPIMS/CFUBMS) deposition technique. The average transmittance of the Si3N4 films on the glass in the visible range is 83.9 % and its hardness is 29.8 Gpa. After introducing 3 sccm O2 gas, the hardness of silicon oxynitride films decreases to 19 Gpa. However its average transmittance on the glass increases to 88.6 % in the visible range. Finally a 5-layer AR coating is deposited on one side glass. Its average transmittance is 93.2 % and its hardness is larger to 19 Gpa.
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