材料科学
开裂
复合数
干涉测量
复合材料
X射线
光学
物理
作者
Masaki Kotani,Yoshihisa Tanaka,Hiroshi Hatta,Yoshinori Kagawa
标识
DOI:10.1016/j.jeurceramsoc.2024.116674
摘要
We developed a Talbot–Lau interferometry-based X-ray imaging system with a novel material testing system and studied its feasibility for monitoring the damage evolution process in SiC/SiC composites directly. We tensile-tested a polymer-derived unidirectional mini-composite, the specimen was repeatedly loaded and unloaded, the maximum load was successively increased, and images were captured when the specimen was tensed at the maximum load and when released. Unique X-ray images were obtained, and by comparing them with conventional X-ray computed tomography absorption images, we ascertained the advantage of Talbot–Lau interferometry-based X-ray in terms of low-magnification crack detection over very short periods. The results demonstrate that the proposed X-ray interferometry can detect the damage evolution of the composite in the form of randomly initiated transverse cracks in the matrix, even after unloading. These results indicate that Talbot–Lau interferometry-based X-ray imaging is viable as a nondestructive inspection tool for SiC/SiC composites.
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