Maged Abdelsamie,Tim Kodalle,Mriganka Singh,Carolin M. Sutter‐Fella
标识
DOI:10.1002/9783527829026.ch15
摘要
This chapter describes the application of in situ characterization to the fabrication of halide perovskite thin films to understand formation pathways and gain mechanistic insights into thermodynamically and kinetically driven processes during formation. The main techniques discussed are in situ X-ray and optical spectroscopy characterization.