作者
Francisco García‐Moreno,Paul H. Kamm,Tillmann Robert Neu,Mareike Wegener,Stephan Börner,Dirk Dittrich,Christian M. Schlepütz,John Banhart
摘要
Journal Article X-ray Tomoscopy: Time-resolved Microtomography for Materials Science Get access Francisco García-Moreno, Francisco García-Moreno Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Berlin, Germany Corresponding author: garcia-moreno@helmholtz-berlin.de Search for other works by this author on: Oxford Academic Google Scholar Paul H Kamm, Paul H Kamm Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Tillmann R Neu, Tillmann R Neu Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Mareike Wegener, Mareike Wegener Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Stephan Börner, Stephan Börner Fraunhofer Institute for Material and Beam Technology - IWS Dresden, Dresden, Germany Search for other works by this author on: Oxford Academic Google Scholar Dirk Dittrich, Dirk Dittrich Fraunhofer Institute for Material and Beam Technology - IWS Dresden, Dresden, Germany Search for other works by this author on: Oxford Academic Google Scholar Christian M Schlepütz, Christian M Schlepütz Swiss Light Source, Paul Scherrer Institute, Villigen, Switzerland Search for other works by this author on: Oxford Academic Google Scholar John Banhart John Banhart Institute of Applied Materials, Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, GermanyInstitute of Materials Science and Technology, Technische Universität Berlin, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 290–291, https://doi.org/10.1017/S1431927622001969 Published: 01 August 2022