外延
范德瓦尔斯力
石墨烯
材料科学
半导体
增长模型
化学物理
氮化物
基质(水族馆)
纳米技术
原子单位
光电子学
凝聚态物理
物理
量子力学
分子
海洋学
图层(电子)
地质学
经济
微观经济学
作者
Lin Hu,Danshuo Liu,Fawei Zheng,Xuelin Yang,Yugui Yao,Bo Shen,Bing Huang
标识
DOI:10.1103/physrevlett.133.046102
摘要
The successful growth of non-van der Waals (vdW) group-III nitride epilayers on vdW substrates not only opens an unprecedented opportunity to obtain high-quality semiconductor thinfilm but also raises a strong debate for its growth mechanism. Here, combining multiscale computational approaches and experimental characterization, we propose that the growth of a nitride epilayer on a vdW substrate, e.g., AlN on graphene, may belong to a previously unknown model, named hybrid vdW epitaxy (HVE). Atomic-scale simulations demonstrate that a unique interfacial hybrid-vdW interaction can be created between AlN and graphene, and, consequently, a first-principles-based continuum growth model is developed to capture the unusual features of HVE. Surprisingly, it is revealed that the in-plane and out-of-plane growth are strongly correlated in HVE, which is absent in existing growth models. The concept of HVE is confirmed by our experimental measurements, presenting a new growth mechanism beyond the current category of material growth.
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