扫描透射电子显微镜
扫描电子显微镜
常规透射电子显微镜
扫描共焦电子显微镜
材料科学
电子
光学
透射电子显微镜
显微镜
高分辨率透射电子显微镜
反射高能电子衍射
显微镜
电子显微镜
能量过滤透射电子显微镜
电子衍射
电子断层摄影术
电子束诱导沉积
衍射
分辨率(逻辑)
物理
纳米技术
计算机科学
人工智能
量子力学
作者
Cheng Sun,Erich Müller,Matthias Meffert,Dagmar Gerthsen
标识
DOI:10.1017/s1431927618000181
摘要
Abstract Transmission electron microscopy (TEM) with low-energy electrons has been recognized as an important addition to the family of electron microscopies as it may avoid knock-on damage and increase the contrast of weakly scattering objects. Scanning electron microscopes (SEMs) are well suited for low-energy electron microscopy with maximum electron energies of 30 keV, but they are mainly used for topography imaging of bulk samples. Implementation of a scanning transmission electron microscopy (STEM) detector and a charge-coupled-device camera for the acquisition of on-axis transmission electron diffraction (TED) patterns, in combination with recent resolution improvements, make SEMs highly interesting for structure analysis of some electron-transparent specimens which are traditionally investigated by TEM. A new aspect is correlative SEM, STEM, and TED imaging from the same specimen region in a SEM which leads to a wealth of information. Simultaneous image acquisition gives information on surface topography, inner structure including crystal defects and qualitative material contrast. Lattice-fringe resolution is obtained in bright-field STEM imaging. The benefits of correlative SEM/STEM/TED imaging in a SEM are exemplified by structure analyses from representative sample classes such as nanoparticulates and bulk materials.
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