辐照
电子束处理
材料科学
电子束诱导沉积
电子
电子显微镜
辐射损伤
阴极射线
纳米技术
原子物理学
透射电子显微镜
化学物理
化学
扫描透射电子显微镜
光学
物理
核物理学
作者
Tao Xu,Zheng He,Jianbo Wang,Florain Banhart,Litao Sun
标识
DOI:10.1007/978-981-19-6845-7_2
摘要
Electron beam irradiation of specimens is often referred to as damage but is inevitable in electron microscopy as the energetic electron beam interacts with the specimen while passing through the specimen. The damage may accumulate over time and lead to visible changes in the structure or chemistry of the specimen. Therefore, electron irradiation effects should be carefully evaluated in in situ experiments in the electron microscope. Although radiation damage is normally an unwelcome artifact, under certain conditions electron irradiation can provide a tool to trigger the local structural evolution or chemical reactivity in a controllable way. The structural transformation can thus be monitored in real time with atomic resolution. Consequently, in situ irradiation experiments are beneficial to reveal the physics behind irradiation effects, explore nonequilibrium states of nanosystems and extend the technical applicability of electron irradiation. In this chapter, we summarize the physical principles of electron irradiation effects including atom displacements, surface sputtering, electrostatic charging, radiolysis, electron beam heating, and deposition. We also present some examples of electron irradiation-induced processes at the atomic scale, such as defect dynamics, phase transformations, bottom-up growth, top-down fabrication, and mechanical deformation. Particular emphasis is put on electron beam-induced processes inside the TEM where electron beam irradiation plays an important role.
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