数据表
碳化硅
汽车工业
可靠性(半导体)
MOSFET
稳健性(进化)
功率半导体器件
数码产品
电力电子
电气工程
汽车电子
可靠性工程
宽禁带半导体
计算机科学
电子工程
工程物理
材料科学
功率(物理)
电压
工程类
晶体管
光电子学
生物化学
物理
化学
量子力学
航空航天工程
冶金
基因
作者
Alberto Marcuzzi,Diana Favero,Carlo De Santi,Gaudenzio Meneghesso,Enrico Zanoni,Matteo Meneghini
标识
DOI:10.23919/aeitautomotive58986.2023.10217233
摘要
This work consists of a comprehensive review and outlook at commercially available silicon carbide (SiC) MOSFETs for next-generation power electronics systems. The analysis starts from datasheet specifications and is focused on automotive applications. Devices are compared also with a silicon MOSFET reference, highlighting peculiarities and advantages of SiC. The physical reasons behind those advantages are also briefly explained. In the second part of the work, main reliability concerns for SiC power devices are addressed, like Threshold Voltage Shift, Gate Oxide Failure and Short Circuit Robustness. Recent results from literature are reported to give an indication on the state-of-the art performances and expectations for the future.
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