元素分析
材料科学
电子束物理气相沉积
钼
薄膜
蒸发
氧化物
电致变色
阴极射线
分析化学(期刊)
过渡金属
纳米技术
电子
冶金
无机化学
化学
物理化学
热力学
量子力学
物理
催化作用
生物化学
色谱法
电极
作者
R. Sivakumar,V. Vijayan,V. Ganesan,M. Jayachandran,C. Sanjeeviraja
标识
DOI:10.1088/0964-1726/14/6/013
摘要
Thin films of transition metal oxides are very important in electrochromic applications. Molybdenum oxide (MoO3) thin films were prepared by using one of the physical vapour depositions of the electron beam evaporation technique in a vacuum of the order of 10−6 mbar. The detailed elemental analysis of the films was performed by a particle-induced x-ray emission (PIXE) study and the nanosurface nature of the films was studied by using an atomic force microscopy (AFM) analysis. To the best of our knowledge this is the first time PIXE analysis has been used for the elemental studies of electron beam evaporated MoO3 films.
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