折射率
硫系化合物
材料科学
红外线的
光学
干涉测量
航程(航空)
索引(排版)
波长
硫系玻璃
光电子学
物理
计算机科学
万维网
复合材料
作者
Asuka Nakatani,Morio Matsumoto,Goichi Sakai,Takenobu Suzuki,Yasutake Ohishi
标识
DOI:10.35848/1347-4065/acabf2
摘要
Abstract We propose a method of merging the minimum deviation and the interferometric method to determine the refractive index dispersions of glasses in a wide range of the mid-infrared region with high accuracy. By the proposed method, the refractive index dispersions of telluride glasses, included in chalcogenide glasses, are successfully determined in the wavelength range from 3 to around 20 μ m. The accuracy of the refractive index by the proposed method is no more than 1 × 10 −3 .
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