干涉测量
液晶
马赫-曾德尔干涉仪
光学
干扰(通信)
光路
电压
光路长度
材料科学
相(物质)
物理
旋转(数学)
光电子学
电信
量子力学
频道(广播)
几何学
数学
计算机科学
作者
Akira Terazawa,Satoshi Yokotsuka,Hiroyuki Okada
标识
DOI:10.35848/1347-4065/ad16be
摘要
Abstract A Mach–Zehnder interferometer with an optical phase control by a twisted nematic (TN) liquid crystal (LC) device was studied. In a typical TN LC device, a change in the optical rotation state of π /2 can be obtained by applying a voltage of about 5 V with a cell thickness of several-micron. The TN cell is inserted into one optical path in the Mach–Zehnder interferometer. We obtained a pattern change when voltage was applied to the LC cell due to the change of the optical interference state. As a result, a change in the number of photons under weak light conditions is observed.
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