半导体
电压
载流子
半导体器件
电荷(物理)
光电子学
电流(流体)
空间电荷
电子迁移率
材料科学
电气工程
物理
纳米技术
工程类
电子
量子力学
图层(电子)
标识
DOI:10.1103/physrevapplied.11.054079
摘要
Mobility measurements using single-carrier devices are one of the most common means for probing charge transport in intrinsic semiconductors; however, the built-in voltage must be known in advance, for precise analysis of the current-voltage curves obtained from measuring space-charge-limited current. The author presents an easy, direct analytical model for determining the built-in voltage of a single-carrier device directly from the $J\ensuremath{-}V$ curves, without any knowledge of the charge-carrier mobility. This approach is expected to be immediately and widely useful to the large community working on semiconductor physics and devices.
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