错误检测和纠正
计算机科学
奇偶校验位
编码器
编码增益
突发错误
算法
误码率
解码方法
编码(社会科学)
编码(内存)
数学
统计
操作系统
人工智能
作者
S. V. S. Prasad,P. Natarajan,L.Bhavani Shankar
出处
期刊:2021 International Conference on Intelligent Technologies (CONIT)
日期:2021-06-25
标识
DOI:10.1109/conit51480.2021.9498371
摘要
It’s not uncommon to use Error-Correction Codes (ECCs) with higher correction capacity at the system level to protect memory from Multiple Bit Upsets (MBUs). As a result, developing ECCs with enhanced error correction and less repetition, particularly for adjoining ECCs, has become a key challenge.. The existing codes such as center around for reducing MBU can able to adjust up to 3-bit errors. The affected bits can be undoubtedly increment to more than three-bit error with the innovation scales and cell division distance decline. As a result, previous approaches are no longer adequate to meet the accuracy requirements of applications in harsh environments. A method for increasing three bit burst error-correction coding with QAEC is provided in this paper. The design requirements are first given, and then a search algorithm is devised to locate coding strategies that adhere to the constraints. The H matrices of the acquired three bit error correction with QAEC are shown. With a three-bit burst error code, they don’t require any extra parity check bits. The performance of three-bit BEC is significantly improved by applying the novel technique to earlier three-bit burst error codes. An example is used to show the suggested codes’ encoding and decoding methods. The 45-nm library was used for the design of encoders and decoders and the results demonstrating that the codes have a medium amount of delay and area in order to meet the required correction capability extension.
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