单层
薄脆饼
图层(电子)
原子层沉积
沉积(地质)
材料科学
原子单位
纳米技术
比例(比率)
光电子学
化学工程
工程类
物理
量子力学
生物
古生物学
沉积物
作者
Dae‐Hyun Kim,Jae Chan Park,Jeongwoo Park,Deok‐Yong Cho,Woo‐Hee Kim,Bonggeun Shong,Ji‐Hoon Ahn,Tae Joo Park
标识
DOI:10.1021/acs.chemmater.1c00729
摘要
Monolayer transition metal dichalcogenide compounds with two-dimensional (2D) layered structures may be used as next-generation active materials for electronic and optoelectronic devices. A reliable method for creating high-quality, wafer-scale material with well-controlled large-area growth is required for industrial applications. Two-dimensional material atomic layer deposition (ALD) can be used as an atomically flat monolayer film, but its deposition characteristics limit perfect monolayer formation. Herein, we propose a novel ALD chemical route for uniform monolayer MoS2 film deposition at the wafer scale. We first modulate the precursor injection step to precisely control one cycle's adsorbed precursor amount in a range exceeding a "typical" ALD reaction. Utilizing this process, we successfully created a complete monolayer MoS2 film in one ALD cycle. The film exhibited excellent uniformity at the wafer scale, and its luminescence quantum efficiency was approximately 9 times greater than that of film formed via conventional ALD. These results indicate this method can be employed to obtain complete single layers or to develop high-quality monolayer-scale 2D materials.
科研通智能强力驱动
Strongly Powered by AbleSci AI