平版印刷术
纳米
纳米技术
分辨率(逻辑)
材料科学
物理
光学
计算机科学
人工智能
作者
Stephen Y. Chou,Peter R. Krauss,Preston J. Renstrom
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:1996-04-05
卷期号:272 (5258): 85-87
被引量:2205
标识
DOI:10.1126/science.272.5258.85
摘要
A high-throughput lithographic method with 25-nanometer resolution and smooth vertical sidewalls is proposed and demonstrated. The technique uses compression molding to create a thickness contrast pattern in a thin resist film carried on a substrate, followed by anisotropic etching to transfer the pattern through the entire resist thickness. Metal patterns with a feature size of 25 nanometers and a period of 70 nanometers were fabricated with the use of resist templates created by imprint lithography in combination with a lift-off process. With further development, imprint lithography should allow fabrication of sub-10-nanometer structures and may become a commercially viable technique for manufacturing integrated circuits and other nanodevices.
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