残余物
模棱两可
拉伤
无穷小应变理论
衍射
失真(音乐)
笛卡尔坐标系
对角线的
匹配(统计)
张量(固有定义)
数学
材料科学
光学
计算机科学
物理
几何学
算法
相(物质)
统计
医学
放大器
光电子学
CMOS芯片
量子力学
内科学
程序设计语言
标识
DOI:10.1080/09500830500041146
摘要
The method of residual strain determination using convergent beam electron diffraction (CBED) is attractive because of its good spatial resolution. However, attempts to obtain all six independent strain components from a CBED pattern lead to ambiguous results. This paper contains analysis of the ambiguities based on the complete algorithm for matching experimental and strain-dependent simulated CBED patterns. The strain parameters which are not determinable by the CBED method are identified by examination of the most common goodness-of-fit functions. The indeterminable parameters are confirmed to be the ‘13’ and ‘23’ components and a combination of the diagonal components of the tensor given in the Cartesian systems having the ‘3’ axis parallel to the beam direction. The ambiguity can be eliminated based on multiple diffraction patterns. It is shown that two different patterns may be insufficient to get a unique strain tensor. The ambiguity can be removed only if certain characteristics of the two patterns are different, or if more than two patterns are used.
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