灵敏度(控制系统)
物理
光电子学
分析化学(期刊)
材料科学
化学
电子工程
有机化学
工程类
作者
Dan Zhang,Fangzhou Li,Huang Rongjie,Zhenhua Tang,Yanghui Liu,Wei Zheng
出处
期刊:IEEE Electron Device Letters
[Institute of Electrical and Electronics Engineers]
日期:2022-06-15
卷期号:43 (8): 1295-1298
被引量:6
标识
DOI:10.1109/led.2022.3183194
摘要
In this work, a low-temperature solution process is proposed to synthesize Lu 2 O 3 films with few surface defects for the purpose of fabricating high-performance deep-ultraviolet (DUV) detectors. Based on the solution-processed Lu 2 O 3 film treated at 250 °C, a high-sensitivity Lu 2 O 3 /GaN DUV photovoltaic detector is fabricated, which has exhibited excellent performance in many aspects. At 0 V bias voltage, it displays a peak photoresponsivity of 41.6 mA/W at 258 nm and a DUV to visible rejection ratio ( $\text{R}_{258\,\text{nm}} / \text{R}_{405\,\text{nm}}$ ) higher than two orders of magnitude. What’s more, compared with devices based on high-temperature (500 °C) solution-processed (H-T) Lu 2 O 3 film, the device prepared in this way shows a greater photoresponsivity and a response speed faster than an order of magnitude, which can be attributed to the fewer surface defects aroused during the low-temperature solution process. The great characteristics achieved suggest the Lu 2 O 3 film treated by the method of low-temperature solution process can be applied to fabricating high-performance DUV detectors.
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