材料科学
下降(电信)
润湿
光学
干涉显微镜
弹性(物理)
波长
显微镜
坐滴法
复合材料
显微镜
涂层
光电子学
物理
电信
计算机科学
作者
Surjyasish Mitra,Sirshendu Misra,Tuan Tran,Sushanta K. Mitra
出处
期刊:Langmuir
[American Chemical Society]
日期:2022-06-14
卷期号:38 (25): 7750-7758
被引量:9
标识
DOI:10.1021/acs.langmuir.2c00789
摘要
A liquid drop resting on a soft solid deforms the surface at the three-phase contact line. The surface deformation, also called "wetting ridge", varies in size from nanoscales to microscales, depending on the elasticity and thickness of the soft layer. In this work, we probe how surface elasticity and coating thickness influences normal and tangential surface deformation profiles induced by a sessile liquid drop using dual-wavelength reflection interference contrast microscopy. Furthermore, we experimentally verify the appropriate characteristic length scale, which closely describes the ridge profiles on both thick and thin soft layers for two different surface elasticities.
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