材料科学
电阻随机存取存储器
静态随机存取存储器
石墨烯
非易失性存储器
纳米复合材料
光电子学
弯曲
电极
导电体
氧化物
形状记忆聚合物
复合材料
纳米技术
电压
聚合物
电气工程
化学
冶金
物理化学
工程类
作者
Enming Zhao,Shuangqiang Liu,Xiaodan Liu,Chen Wang,Guangyu Liu,Chuanxi Xing
出处
期刊:NANO
[World Scientific]
日期:2020-09-01
卷期号:15 (09): 2050111-2050111
被引量:6
标识
DOI:10.1142/s1793292020501118
摘要
Flexible resistive switching memory devices based on graphene oxide (GO) polymer nanocomposite were prepared on flexible substrate to research the influence of bending on resistive switching behavior. The devices showed evident response in resistive switching memory characteristics to flexible bending. The 2000 cycles flexible bending leads to the switch of resistive switching memory characteristic from write-once-read-many time memory (WORM) to static random access memory (SRAM). Both WORM and SRAM memory properties are all repeatable, and the threshold switching voltage also showed good consistency. The resistive switching mechanism is attributed to the formation of carbon-rich conductive filaments for nonvolatile WORM characteristics. The bending-induced micro-crack may be responsible for the partial broken of the electrical channels, and may lead to the volatile SRAM characteristics.
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