氧烷
X射线光电子能谱
电子顺磁共振
表征(材料科学)
傅里叶变换红外光谱
材料科学
化学工程
金属有机骨架
光谱学
核化学
化学
纳米技术
物理化学
核磁共振
工程类
吸附
物理
量子力学
作者
Sergio Rojas‐Buzo,Davide Salusso,Francesca Bonino,Maria Cristina Paganini,Silvia Bordiga
标识
DOI:10.1016/j.mtchem.2022.101337
摘要
Ce3+ presence and formation in Ce-based UiO-66 Metal-Organic Framework (MOF) still presents a debated evaluation between the employed characterization techniques. In this work, we have prepared a defective UiO-66(Ce) and investigated the nature of Ce3+ sites on the CeOx clusters. Laboratory techniques (EPR, XPS, UV–Vis and FTIR spectroscopy) were compared with operando Ce M5-edge NEXAFS to study Ce3+ accessibility. All the employed techniques presented different degrees of accessibility or reliability (e.g., sample damage or not sufficient sensitivity). Among the obtained results, EPR, UV–Vis and NEXAFS spectroscopies unraveled Ce4+→Ce3+ conversion during the sample dehydration. The MOF structure was not damaged by neither water loss nor the beam, directly relating Ce oxidation state to the water content, opening a new route to both synthesis of stable and active MOFs and non-invasive characterization strategies. Finally, laboratory measurements considerations were exploited for studying Ce3+ formation in Zr-doped UiO-66(Ce) samples.
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