扫描电镜
光学
波前
显微镜
自适应光学
空间光调制器
光学切片
受激发射
光漂白
材料科学
薄层荧光显微镜
物理
激光器
荧光
扫描共焦电子显微镜
作者
Siqing Dai,Andrei Yu Kobitski,Amirhossein Barati Sedeh,Süheyla Eroğlu-Kayıkçı,Lennart Hilbert,G. Ulrich Nienhaus
出处
期刊:ACS Photonics
[American Chemical Society]
日期:2024-01-06
卷期号:11 (1): 310-320
被引量:1
标识
DOI:10.1021/acsphotonics.3c01558
摘要
Stimulated emission depletion (STED) microscopy is a powerful super-resolution imaging technique for investigating the subcellular structure of biological samples in all three spatial dimensions. Its application to thick specimens is challenging, however, as sample-induced optical aberrations distort the intricate phase patterns of the STED beams and, consequently, their focal intensity distribution. Notably, the central intensity minimum, which is essential for resolution enhancement, is lifted at larger sample depths. Here we present a technique for correction of STED beam aberrations featuring minimal light exposure of the samples to avoid photobleaching and phototoxicity. We quantify STED beam aberrations by using modal wavefront sensing with spatial light modulators (SLMs) as adaptive optics (AO) elements based on reflection imaging of gold beads immobilized at the top and bottom surfaces enclosing the thick (≥100 μm) biological specimen. Based on this information, wavefront aberrations can be successfully compensated for all depths by linear interpolation of the correction parameters. We demonstrate the excellent imaging performance of AO 3D stimulated emission double depletion (STEDD) microscopy on cell nuclei of zebrafish embryos.
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