异质结
材料科学
光电子学
吸收(声学)
带隙
电场
单层
衰减系数
电子
范德瓦尔斯力
光电探测器
光学
物理
纳米技术
复合材料
量子力学
分子
作者
Xianxiao Liang,Hongquan Zhao,Yang Zhao,Xueyi Deng,Zeyun Xiao,Xiao-Yu Peng,Hongkuan Yuan,Xuan Shi
出处
期刊:Physica Scripta
[IOP Publishing]
日期:2024-01-11
卷期号:99 (2): 025986-025986
被引量:3
标识
DOI:10.1088/1402-4896/ad1da9
摘要
Abstract Van der Waals heterojunctions based on two-dimensional (2D) materials hold great potential applications in photodetectors. Using the density functional theory (DFT) method, the structures, electronic and optical properties of van der Waals WSe 2 /Si 2 H heterojunction are investigated. 1.32 eV of indirect bandgap is calculated from the WSe 2 /Si 2 H heterojunction, which is 0.3 eV and 0.1 eV smaller than those of its monolayer WSe 2 and Si 2 H. This contributes to the photocarrier generations, and the Type-II heterojunction also benefits to the separation of the photogenerated electron and hole pairs. A significant hole mobility 1.05 × 10 4 cm 2 V −1 s −1 of the heterojunction along the y-direction is obtained. Moreover, a high Ultraviolet light (UV) absorption coefficient is presented in the heterojunction. The heterojunction transforms to Type-I under a vertical electric field, with the bandgap, orientation and amount of transfer electrons modulated sufficiently. As a result, the optical absorption coefficient of the heterojunction is also improved significantly, leading to the red-shift of the absorption spectrum. These excellent properties address the WSe 2 /Si 2 H heterojunction one of the good candidates for UV detectors.
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